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Analysis of graphene via atomic moire interferometry

moire patternsIn a groundbreaking series of experiments, scientists in the United States managed to develop a new method of analyzing how graphene sheets are stacked on top of each other. The technique is also suitable for determining which areas of the compound are subjected to most strain, when the material is placed inside more complex structures. All of this can be inferred using moire patterns, which are interference patterns that appear at an atomic scale, when two layers of atoms are placed on top of each other imperfectly, as in slightly askew (image courtesy of NIST).

The research team that conducted the new investigation features physicists from the US National Institutes of Standards and Technology (NIST) and the Georgia Institute of Technology (Georgia Tech). The experts say that the moire patterns can also be used on multiple grids or atom arrays, not only on two. They add that using “atomic moire interferometry” can also help scientists determine the rotational orientation of the graphene sheets used in a variety of technological applications. Their work is published in the Physical Review B journal.

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